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"Wafer-level testing with a membrane probe."

Brian Leslie, Farid Matta (1989)

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DOI: 10.1109/54.20385

access: closed

type: Journal Article

metadata version: 2021-03-01

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Brian Leslie, Farid Matta:
Wafer-level testing with a membrane probe. IEEE Des. Test 6(1): 10-17 (1989)

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