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"Tracking Uncertainty with Probabilistic Logic Circuit Testing."

Smita Krishnaswamy, Igor L. Markov, John P. Hayes (2007)

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DOI: 10.1109/MDT.2007.146

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/KrishnaswamyMH07
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  persistent URL:
  - https://dblp.org/rec/journals/dt/KrishnaswamyMH07
Smita Krishnaswamy, Igor L. Markov, John P. Hayes:
Tracking Uncertainty with Probabilistic Logic Circuit Testing. IEEE Des. Test Comput. 24(4): 312-321 (2007)

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