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"Design for Testability and Self-Testing Approaches for Bit-Serial signal ..."

Nikos Kanopoulos, G. Thomas Mitchell (1984)

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DOI: 10.1109/MDT.1984.5005609

access: closed

type: Journal Article

metadata version: 2020-11-11

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Nikos Kanopoulos, G. Thomas Mitchell:
Design for Testability and Self-Testing Approaches for Bit-Serial signal Processors. IEEE Des. Test 1(2): 52-59 (1984)

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