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"IDDQ Test and Diagnosis of CMOS Circuits."

Eugeni Isern, Joan Figueras (1995)

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DOI: 10.1109/MDT.1995.473314

access: closed

type: Journal Article

metadata version: 2023-09-20

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  - https://dblp.org/rec/journals/dt/IsernF95
Eugeni Isern, Joan Figueras:
IDDQ Test and Diagnosis of CMOS Circuits. IEEE Des. Test Comput. 12(4): 60-67 (1995)

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