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"Test and Reliability: Partners in IC Manufacturing, Part 2."

Charles F. Hawkins et al. (1999)

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DOI: 10.1109/54.808215

access: closed

type: Journal Article

metadata version: 2021-10-14

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  dblp key:
  - journals/dt/HawkinsSSD99
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  persistent URL:
  - https://dblp.org/rec/journals/dt/HawkinsSSD99
Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin:
Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. 16(4): 66-73 (1999)

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