"Variation-Tolerant, Power-Safe Pattern Generation."

V. R. Devanathan, C. P. Ravikumar, V. Kamakoti (2007)

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DOI: 10.1109/MDT.2007.148

access: closed

type: Journal Article

metadata version: 2020-09-10

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V. R. Devanathan, C. P. Ravikumar, V. Kamakoti:
Variation-Tolerant, Power-Safe Pattern Generation. IEEE Des. Test Comput. 24(4): 374-384 (2007)

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