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"Collection and Analysis of Microprocessor Design Errors."

David Van Campenhout, Trevor N. Mudge, John P. Hayes (2000)

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DOI: 10.1109/54.895006

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/CampenhoutMH00
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  persistent URL:
  - https://dblp.org/rec/journals/dt/CampenhoutMH00
David Van Campenhout, Trevor N. Mudge, John P. Hayes:
Collection and Analysis of Microprocessor Design Errors. IEEE Des. Test Comput. 17(4): 51-60 (2000)

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