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"Adaptive and Resilient Circuits for Dynamic Variation Tolerance."

Keith A. Bowman et al. (2013)

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DOI: 10.1109/MDAT.2013.2267958

access: closed

type: Journal Article

metadata version: 2021-04-09

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Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Tanay Karnik, Vivek K. De:
Adaptive and Resilient Circuits for Dynamic Variation Tolerance. IEEE Des. Test 30(6): 8-17 (2013)

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