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"On-Chip IDDQ Testing in the AE11 Fail-Stop Controller."

Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein (1998)

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DOI: 10.1109/54.735928

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/BohlLM98
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  persistent URL:
  - https://dblp.org/rec/journals/dt/BohlLM98
Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein:
On-Chip IDDQ Testing in the AE11 Fail-Stop Controller. IEEE Des. Test Comput. 15(4): 57-65 (1998)

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