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"Fundamental Timing Problems in Testing MOS VLSI on Modern ATE."

Mark R. Barber (1984)

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DOI: 10.1109/MDT.1984.5005657

access: closed

type: Journal Article

metadata version: 2020-11-11

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Mark R. Barber:
Fundamental Timing Problems in Testing MOS VLSI on Modern ATE. IEEE Des. Test 1(3): 90-97 (1984)

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