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"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs ..."

Ke Huang et al. (2024)

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DOI: 10.1109/MDAT.2023.3283349

access: closed

type: Journal Article

metadata version: 2024-03-16

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Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris:
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. IEEE Des. Test 41(2): 15-22 (2024)

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