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"Time-Frequency Analysis of a Variable Stiffness Model for Fault Development."

Leon Cohen et al. (2002)

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DOI: 10.1006/DSPR.2002.0458

access: closed

type: Journal Article

metadata version: 2020-02-20

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  - https://dblp.org/rec/journals/dsp/CohenGHHLS02
Leon Cohen, Lorenzo Galleani, Robert A. Hedges, David Hughes, Patrick J. Loughlin, Bruce W. Suter:
Time-Frequency Analysis of a Variable Stiffness Model for Fault Development. Digit. Signal Process. 12(2-3): 429-440 (2002)

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