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"Artificial intelligence-assisted auto-optical inspection toward the stain ..."

Yongwoo Lee et al. (2023)

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DOI: 10.1016/J.DISPLA.2023.102478

access: closed

type: Journal Article

metadata version: 2023-09-24

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Yongwoo Lee, Gichang Lee, Hyunyoung Choi, Hyeryoung Park, Min Jae Ko:
Artificial intelligence-assisted auto-optical inspection toward the stain detection of an organic light-emitting diode panel at the backplane fabrication step. Displays 79: 102478 (2023)

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