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"Improving the reliability of chip-off forensic analysis of NAND flash ..."

Aya Fukami et al. (2017)

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DOI: 10.1016/J.DIIN.2017.01.011

access: closed

type: Journal Article

metadata version: 2024-05-08

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Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu:
Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digit. Investig. 20 Supplement: S1-S11 (2017)

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