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"Improving the reliability of chip-off forensic analysis of NAND flash ..."
Aya Fukami et al. (2017)
- Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu:
Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digit. Investig. 20 Supplement: S1-S11 (2017)
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