"Understanding and Measuring the Jitter Generated by Digital CMOS Gates."

Keith A. Jenkins (2025)

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DOI: 10.1007/S00034-024-02885-X

access: closed

type: Journal Article

metadata version: 2025-03-07

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Keith A. Jenkins:
Understanding and Measuring the Jitter Generated by Digital CMOS Gates. Circuits Syst. Signal Process. 44(2): 1334-1348 (2025)

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