"Bayes analysis of one-shot device testing data with correlated failure ..."

Ashkamini, Reema Sharma, Satyanshu K. Upadhyay (2025)

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DOI: 10.1080/03610918.2023.2288802

access: closed

type: Journal Article

metadata version: 2025-07-04

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Ashkamini, Reema Sharma, Satyanshu K. Upadhyay:
Bayes analysis of one-shot device testing data with correlated failure modes using copula models. Commun. Stat. Simul. Comput. 54(5): 1522-1541 (2025)

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