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"Frequentist nonparametric goodness-of-fit tests via marginal likelihood ..."

Jeffrey D. Hart, Taeryon Choi, Seongbaek Yi (2016)

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DOI: 10.1016/J.CSDA.2015.10.013

access: closed

type: Journal Article

metadata version: 2020-02-18

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Jeffrey D. Hart, Taeryon Choi, Seongbaek Yi:
Frequentist nonparametric goodness-of-fit tests via marginal likelihood ratios. Comput. Stat. Data Anal. 96: 120-132 (2016)

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