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ORCID"New Analysis to Measure the Capacitance and Conductance of MOS Structure ..."
Wagah Farman Mohammad (2011)
- Wagah Farman Mohammad:
New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits. Circuits Syst. 2(3): 145-150 (2011)
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