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"RHEED intensities from two-dimensional heteroepitaxial nanoscale systems ..."

Andrzej Daniluk (2017)

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DOI: 10.1016/J.CPC.2017.08.019

access: closed

type: Journal Article

metadata version: 2020-02-21

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Andrzej Daniluk:
RHEED intensities from two-dimensional heteroepitaxial nanoscale systems of GaN on a 3C-SiC(111) surface. Comput. Phys. Commun. 221: 419-420 (2017)

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