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"StyleX: A Trainable Metric for X-ray Style Distances."
Dominik Eckert et al. (2024)
- Dominik Eckert, Christopher Syben, Christian Hümmer, Ludwig Ritschl, Steffen Kappler, Sebastian Stober:
StyleX: A Trainable Metric for X-ray Style Distances. CoRR abs/2405.14718 (2024)
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