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"OCR is All you need: Importing Multi-Modality into Image-based Defect ..."

Chih-Chung Hsu et al. (2024)

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DOI: 10.48550/ARXIV.2403.11536

access: open

type: Informal or Other Publication

metadata version: 2024-04-08

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  dblp key:
  - journals/corr/abs-2403-11536
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  - https://dblp.org/rec/journals/corr/abs-2403-11536
Chih-Chung Hsu, Chia-Ming Lee, Chun-Hung Sun, Kuang-Ming Wu:
OCR is All you need: Importing Multi-Modality into Image-based Defect Detection System. CoRR abs/2403.11536 (2024)

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