Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Accurate Time-segmented Loss Model for SiC MOSFETs in Electro-thermal ..."

Jialin Zheng et al. (2023)

> Home

Details and statistics

DOI: 10.48550/ARXIV.2311.07029

access: open

type: Informal or Other Publication

metadata version: 2023-11-15

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/corr/abs-2311-07029
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2311-07029
Jialin Zheng, Zhengming Zhao, Han Xu, Weicheng Liu, Yangbin Zeng:
Accurate Time-segmented Loss Model for SiC MOSFETs in Electro-thermal Multi-Rate Simulation. CoRR abs/2311.07029 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.