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"SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor ..."

Vic De Ridder et al. (2023)

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DOI: 10.48550/ARXIV.2308.07180

access: open

type: Informal or Other Publication

metadata version: 2023-08-23

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  dblp key:
  - journals/corr/abs-2308-07180
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  - https://dblp.org/rec/journals/corr/abs-2308-07180
Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge:
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR abs/2308.07180 (2023)

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