"Learning Second Order Local Anomaly for General Face Forgery Detection."

Jianwei Fei et al. (2022)

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DOI: 10.48550/ARXIV.2209.15490

access: open

type: Informal or Other Publication

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/corr/abs-2209-15490
Jianwei Fei, Yunshu Dai, Peipeng Yu, Tianrun Shen, Zhihua Xia, Jian Weng:
Learning Second Order Local Anomaly for General Face Forgery Detection. CoRR abs/2209.15490 (2022)

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