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"STEM image analysis based on deep learning: identification of vacancy ..."
Kihyun Lee et al. (2022)
- Kihyun Lee, Jinsub Park, Soyeon Choi, Yangjin Lee, Sol Lee, Joowon Jung, Jong-Young Lee, Farman Ullah, Zeeshan Tahir, Yong Soo Kim, Gwan-Hyoung Lee, Kwanpyo Kim:
STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of MoS2. CoRR abs/2206.04272 (2022)
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