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"Application of Orthogonal Defect Classification for Software Reliability ..."

Edward Chen et al. (2022)

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DOI: 10.48550/ARXIV.2205.12080

access: open

type: Informal or Other Publication

metadata version: 2022-05-30

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  dblp key:
  - journals/corr/abs-2205-12080
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  - https://dblp.org/rec/journals/corr/abs-2205-12080
Edward Chen, Han Bao, Tate Shorthill, Carl R. Elks, Athira Varma Jayakumar, Nam Dinh:
Application of Orthogonal Defect Classification for Software Reliability Analysis. CoRR abs/2205.12080 (2022)

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