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"Product Inspection Methodology via Deep Learning: An Overview."

Tae-Hyun Kim, Hye-Rin Kim, Yeong-Jun Cho (2021)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-04-07

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2103-16198
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2103-16198
Tae-Hyun Kim, Hye-Rin Kim, Yeong-Jun Cho:
Product Inspection Methodology via Deep Learning: An Overview. CoRR abs/2103.16198 (2021)

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