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"Alleviation of Temperature Variation Induced Accuracy Degradation in ..."

Sourav De, Yao-Jen Lee, Darsen D. Lu (2021)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-10-14

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2103-03111
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2103-03111
Sourav De, Yao-Jen Lee, Darsen D. Lu:
Alleviation of Temperature Variation Induced Accuracy Degradation in Ferroelectric FinFET Based Neural Network. CoRR abs/2103.03111 (2021)

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