"Effect of NBTI/PBTI Aging and Process Variations on Write Failures in ..."

Usman Khalid, Antonio Mastrandrea, Mauro Olivieri (2017)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1712-06934
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1712-06934
Usman Khalid, Antonio Mastrandrea, Mauro Olivieri:
Effect of NBTI/PBTI Aging and Process Variations on Write Failures in MOSFET and FinFET Flip-Flops. CoRR abs/1712.06934 (2017)

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