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"Decreasing defect rate of test cases by designing and analysis for ..."

Muhammad Javed et al. (2012)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1208-5195
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1208-5195
Muhammad Javed, Bashir Ahmad, Zafar Abbas, Allah Nawaz, Muhammad Ali Abid, Ihsan Ullah:
Decreasing defect rate of test cases by designing and analysis for recursive modules of a program structure: Improvement in test cases. CoRR abs/1208.5195 (2012)

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