"Toward Future Systems with Nanoscale Devices: Overcoming the Reliability ..."

Wenjing Rao et al. (2011)

> Home

Details and statistics

DOI: 10.1109/MC.2011.1

access: closed

type: Journal Article

metadata version: 2020-08-12

- view
  authority control:
- export record
  dblp key:
  - journals/computer/RaoYKO11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/computer/RaoYKO11
Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu:
Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge. Computer 44(2): 46-53 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.