"Extending device noise measurement capacity for OFDM-based PLC systems: ..."

Aymen Omri, Javier Hernandez Fernandez, Roberto Di Pietro (2023)

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DOI: 10.1016/J.COMNET.2023.110038

access: open

type: Journal Article

metadata version: 2024-06-08

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Aymen Omri, Javier Hernandez Fernandez, Roberto Di Pietro:
Extending device noise measurement capacity for OFDM-based PLC systems: Design, implementation, and on-field validation. Comput. Networks 237: 110038 (2023)

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