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"Optimal periodic testing policy for circuit with self-testing."

Satoshi Mizutani et al. (2006)

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DOI: 10.1016/J.CAMWA.2005.11.025

access: open

type: Journal Article

metadata version: 2021-02-11

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Satoshi Mizutani, Toshio Nakagawa, Kodo Ito, Hiroaki Sandoh:
Optimal periodic testing policy for circuit with self-testing. Comput. Math. Appl. 51(2): 363-370 (2006)

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