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"ENO and WENO schemes using arc-length based smoothness measurement."

Biswarup Biswas, Ritesh Kumar Dubey (2020)

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DOI: 10.1016/J.CAMWA.2020.10.005

access: closed

type: Journal Article

metadata version: 2023-06-26

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Biswarup Biswas, Ritesh Kumar Dubey:
ENO and WENO schemes using arc-length based smoothness measurement. Comput. Math. Appl. 80(12): 2780-2795 (2020)

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