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"Programmable built-in self-testing of embedded RAM clusters in ..."

Alfredo Benso et al. (2003)

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DOI: 10.1109/MCOM.2003.1232242

access: closed

type: Journal Article

metadata version: 2024-05-07

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Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41(9): 90-97 (2003)

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