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"Generation of Shortest Test Sequences for Detecting Individual Faults of ..."

Stephen S. Yau, Y. S. Tang (1979)

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DOI: 10.1093/COMJNL/22.2.169

access: closed

type: Journal Article

metadata version: 2017-05-20

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Stephen S. Yau, Y. S. Tang:
Generation of Shortest Test Sequences for Detecting Individual Faults of Sequential Circuits. Comput. J. 22(2): 169-172 (1979)

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