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"Multi-Level Random Walk for Software Test Suite Reduction."

Zongzheng Chi et al. (2017)

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DOI: 10.1109/MCI.2017.2670460

access: closed

type: Journal Article

metadata version: 2020-09-05

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Zongzheng Chi, Jifeng Xuan, Zhilei Ren, Xiaoyuan Xie, He Guo:
Multi-Level Random Walk for Software Test Suite Reduction. IEEE Comput. Intell. Mag. 12(2): 24-33 (2017)

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