"Multiple degradation mode analysis via gated recurrent unit mode ..."

Qinyuan Luo et al. (2020)

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DOI: 10.1016/J.COMPIND.2020.103332

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type: Journal Article

metadata version: 2023-06-26

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Qinyuan Luo, Yuanhong Chang, Jinglong Chen, Hongjie Jing, Haixin Lv, Tongyang Pan:
Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment. Comput. Ind. 123: 103332 (2020)

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