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"Machine learning iterative filtering algorithm for field defect detection ..."

Young-Hwan Choi, Jeongsam Yang (2022)

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DOI: 10.1016/J.COMPIND.2022.103740

access: closed

type: Journal Article

metadata version: 2023-08-28

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Young-Hwan Choi, Jeongsam Yang:
Machine learning iterative filtering algorithm for field defect detection in the process stage. Comput. Ind. 142: 103740 (2022)

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