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ORCID"Lie detection using extreme learning machine: A concealed information test ..."
Shubham Dodia et al. (2020)
- Shubham Dodia
, Damodar Reddy Edla, Annushree Bablani, Ramalingaswamy Cheruku:
Lie detection using extreme learning machine: A concealed information test based on short-time Fourier transform and binary bat optimization using a novel fitness function. Comput. Intell. 36(2): 637-658 (2020)
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