"Insights of VG-dependent threshold voltage fluctuations from dual-point ..."

Xuepeng Zhan, Jiezhi Chen, Zhigang Ji (2022)

> Home

Details and statistics

DOI: 10.1007/S11432-021-3330-8

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/chinaf/ZhanCJ22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/chinaf/ZhanCJ22
Xuepeng Zhan, Jiezhi Chen, Zhigang Ji:
Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Sci. China Inf. Sci. 65(8): 1-2 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.