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"A study of residual characteristics in floating gate transistors."

Jia Wang et al. (2018)

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DOI: 10.1007/S11432-017-9145-2

access: closed

type: Journal Article

metadata version: 2023-03-24

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  dblp key:
  - journals/chinaf/WangZXY18
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  - https://dblp.org/rec/journals/chinaf/WangZXY18
Jia Wang, Yiqiang Zhao, Ruishan Xin, Mao Ye:
A study of residual characteristics in floating gate transistors. Sci. China Inf. Sci. 61(6): 069402:1-069402:3 (2018)

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