"Knowledge incorporated support vector machines to detect faults in ..."

Abhijit J. Kulkarni, Vaidyanathan K. Jayaraman, Bhaskar D. Kulkarni (2005)

Details and statistics

DOI: 10.1016/J.COMPCHEMENG.2005.06.006

access: closed

type: Journal Article

metadata version: 2020-05-18

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