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"Polynomial Identity Testing for Depth 3 Circuits."

Neeraj Kayal, Nitin Saxena (2007)

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DOI: 10.1007/S00037-007-0226-9

access: closed

type: Journal Article

metadata version: 2020-03-15

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Neeraj Kayal, Nitin Saxena:
Polynomial Identity Testing for Depth 3 Circuits. Comput. Complex. 16(2): 115-138 (2007)

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