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"Critical Point Detection Using the Length Ratio (LR) for Line Generalization."

Byron P. Nakos, Vasilis Ch. Mitropoulos (2005)

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DOI: 10.3138/W157-5W4P-63V7-7385

access: closed

type: Journal Article

metadata version: 2020-03-24

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  - journals/cartographica/NakosM05
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  - https://dblp.org/rec/journals/cartographica/NakosM05
Byron P. Nakos, Vasilis Ch. Mitropoulos:
Critical Point Detection Using the Length Ratio (LR) for Line Generalization. Cartogr. Int. J. Geogr. Inf. Geovisualization 40(3): 35-51 (2005)

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