"Mixup-based classification of mixed-type defect patterns in wafer bin maps."

Wooksoo Shin, Hyungu Kahng, Seoung Bum Kim (2022)

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DOI: 10.1016/J.CIE.2022.107996

access: closed

type: Journal Article

metadata version: 2023-09-30

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Wooksoo Shin, Hyungu Kahng, Seoung Bum Kim:
Mixup-based classification of mixed-type defect patterns in wafer bin maps. Comput. Ind. Eng. 167: 107996 (2022)

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