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"DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing ..."
Yibo Qiao et al. (2024)
- Yibo Qiao, Zhouzhouzhou Mei, Yuening Luo, Yining Chen
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DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture. Comput. Ind. Eng. 193: 110301 (2024)
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