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"An oversampling method for wafer map defect pattern classification ..."
Eun-Su Kim et al. (2021)
- Eun-Su Kim, Seung-Hyun Choi
, Dong-Hee Lee
, Kwang-Jae Kim, Young-Mok Bae, Young-Chan Oh:
An oversampling method for wafer map defect pattern classification considering small and imbalanced data. Comput. Ind. Eng. 162: 107767 (2021)
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