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"Bayesian inference for mining semiconductor manufacturing big data for ..."

Marzieh Khakifirooz, Chen Fu Chien, Ying-Jen Chen (2018)

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DOI: 10.1016/J.ASOC.2017.11.034

access: closed

type: Journal Article

metadata version: 2022-10-02

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Marzieh Khakifirooz, Chen Fu Chien, Ying-Jen Chen:
Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0. Appl. Soft Comput. 68: 990-999 (2018)

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