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"Defect classification on limited labeled samples with multiscale feature ..."

Jiahuan Liu et al. (2022)

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DOI: 10.1007/S10489-021-02917-Y

access: closed

type: Journal Article

metadata version: 2023-09-30

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  dblp key:
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  - https://dblp.org/rec/journals/apin/LiuGZHZ22
Jiahuan Liu, Fei Guo, Yun Zhang, Binkui Hou, Huamin Zhou:
Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning. Appl. Intell. 52(7): 8243-8258 (2022)

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